题   目: Statistical Analysis of Reliability Test Data

主讲人: Cher Ming Tan (Prof.)

主持人: 刘志伟（副教授）

简  介：

Dr. Tan received his Ph.D in Electrical Engineering from the University of Toronto in 1992.  He has 10 years of working experiences in reliability in electronic industry (both Singapore and Taiwan) before joining Nanyang Technological University as faculty member in 1996 till 2014, and he joined Chang Gung University then. He set up a Center for Reliability Sciences and Technologies in Chang Gung University, and Center for Reliability Engineering in Ming Chi University of Technology since he arrived in Taiwan. He has published more than 300 International Journal and Conference papers with h-index of 21, all in the areas of reliability and failure analysis, and holding 10 patents and 1 copyright for reliability software. He has given 4 keynote talks and more than 30 invited talks in International Conferences. He has written 4 books and 3 book chapters in the field of reliability. He is an Editor of Scientific Report, Editor of IEEE Transaction on Device and Material Reliability, Editorial Advisory board member for Microelectronic Reliability. He is also the Series Editor of SpringerBrief in Reliability. He has more than 30 years of experiences in reliability. He is the past chair of IEEE Singapore Section, Senior member of IEEE and ASQ, Founding Chair of IEEE Nanotechnology Chapter - Singapore Section, Founding Chair of IEEE International Conference on Nanoelectronics. He is in the reviewer board of several International Journals such as Thin Solid Film, Microelectronic Reliability, Microelectronics Engineering etc for more than 10 years. His research interests include reliability and failure physics modeling of electronic components and systems, finite element modeling of materials degradation, statistical modeling of engineering systems, nano-materials and devices reliability, and prognosis & health management of engineering system.

      Reliability is crucial to the success of product sales in today competitive market.  Reliability test is now a common routine to most of the manufacturing. However, the analysis of reliability test data is not straight forward since it involves advanced statistics. Although there are many existence software available for the reliability data analysis, but most of them have inherent assumptions, and without understanding the impact of these assumptions, the use of the software could make the analysis results invalid. This talk introduces the various common misconception in the analysis of reliability test data from which the essential knowledge of reliability statistics will be identified.  Various methods of analysis of the test data obtained at accelerated test conditions will also be introduced, and the cautious use of the Arrhenius equation is also emphasized.  

Welcome to attend!

时间: 2016年12月2日（周五）下午14:30

地点: 沙河校区微固楼137会议室